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Title
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Journal
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64
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I.K. Bdikin, V.V. Shvartsman, Seung-Hyun
Kim, and A.L.Kholkin, ¡°Frequency-dependent shear
piezoelectric response via scanning force microscopy"
|
submitted to Appl. Phys. Lett. (2003)
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63
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I.K. Bdikin, V.V. Shvartsman, Seung-Hyun
Kim, and A.L.Kholkin,
¡°Ferroelectric domain
structure and local piezoelectric properties of sol-gel derived PZT films¡±
|
Mat. Res. Soc. Symp. Proceeding, accepted.
|
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62
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I.K. Bdikin, V.V. Shvartsman, Seung-Hyun
Kim, and A.L.Kholkin,
¡°Frequency-dependent
electromechanical response in ferroelectric materials measured via piezoresponse
force microscopy
¡±
|
Mat. Res. Soc. Symp.
Proceeding, accepted.
|
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61 |
Jeong-Suong Yang, Seung-Hyun Kim,
Chang Young Koo, Jung-Hoon Yeom, Cheol Seong Hwang, Euijoon Yoon,
Dong-Joo Kim, and Jowoong Ha, ¡°Piezoelectric
and pyroelectric properties of PZT films for micro-sensors and actuators¡± |
Integrated Ferroelectrics, in press. |
|
60
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W-K. Jung, Y-S. Choi, C. Bae, B-K. Lee,
Seung-Hyun Kim, H. Shin, "Fabrication
of isolated ferroelectric domains in nano-scale
¡±
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Integrated Ferroelectrics, in press.
|
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59
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H. Maiwa, Seung-Hyun Kim, and
N. Ichinose ¡°
Temperature dependence of electrical and electromechanical
properties of PZT thin films
¡±
|
Appl. Phys. Lett. In press.
|
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58
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Joon-Shik Park, Seung-Hyun Kim,
Hyo-Duk Park, Jowoong Ha, and Sung-Goon Kang, ¡°Characterization of sol-gel multi-coated thick PZT films on
platinized silicon substrates for micro devices applications¡±
|
Jpn. J. Appl. Phys., in
press.
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57
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S-N. Ryoo, S-G. Yoon, and Seung-Hyun
Kim, ¡°Improvement in ferroelectric
properties of Pb(Zr0.35,Ti0.65)O3 thin films
using a Pb2Ru2O7-x conductive interfacial layer for ferroelectric random access
memory application¡±
|
Appl. Phys. Lett., 83(14),
2880 (2003)
|
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56
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Seung-Hyun Kim, Jeong-Suong
Yang, Chang Young Koo, Jung-Hoon Yeom, Euijoon Yoon, Cheol
Seong Hwang, Joon-Shik Park, Sung-Goon Kang, Dong-Joo Kim, and Jowoong Ha,
¡°Dielectric and electromechanical properties of
Pb(Zr,Ti)O3 thin films for piezo-microelectromechanical system
devices¡±
|
Jpn. J. Appl. Phys., Vol. 42 (Part 1, No. 9B),
5952 (2003)
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55
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Jeong-Suong Yang, Seung-Hyun
Kim, Dong-Yeon Park, Euijoon Yoon, Joon-Shik Park, Tae-Song Kim,
Sung-Goon Kang, and Jowoong Ha, ¡°
Thickness effects on the pyroelectic properties of chemical
solution-derived Pb(Zr0.3,Ti0.7)O3 thin films
for the infra-red sensor devices¡±
|
Jpn. J.
Appl. Phys., Vol. 42 (Part 1, No. 9B), 5956 (2003)
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54
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Seung-Hyun
Kim, Chang
Young Koo, letter-spacing:0;
Dong-Yeon Park,
Dong-Su Lee,
Jung-Hoon Yeom, Jieun
Lim Cheol Seong
Hwang, and Jowoong Ha, "Scaling
Issues of Pb(Zr,Ti)O3
Capacitor
Stack for High Density FeRAM Devices" |
J. Kor. Phys. Soc., Vol. 42, S1417 (2003) |
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53
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Seung-Hyun
Kim, Jeong-Suong Yang, Chang
Young Koo, Jung-Hoon Yeom,
Dong-Su Lee, Cheol Seong
Hwang, Kyu-Ho Hwang, and Jowoong Ha, "Electromechanical
Properties of Pb(Zr,Ti)O3
Films
for MEMS Applications" |
J. Kor. Phys. Soc., Vol. 42, S1101 (2003) |
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52
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Seehwa
Jeong , Jin Shi-Zhao, Hye Ryoung Kim,
Dong-Yeon Park,
Cheol Seong
Hwang, Young Ki Han, Cheol Hoon Yang, Ki Young Oh, Seung-Hyun Kim, Dong-Soo
Lee, and Jowoong Ha, "Metal-organic chemical
vapor deposition of Pb(Zr,Ti)O3
thin
films with different precursor solutions
for testing mass-production compatibility" |
J. Electrochem. Soc., Vol. 150, No. 10, C678 (2003) |
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51
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Seung-Hyun
Kim, Chang
Young Koo, Su-Min Ha, Hyun-Jung Woo,
Dong-Yeon Park, Jieun
Lim, Cheol Seong
Hwang, and Jowoong Ha, "Thickness
scaling
of Pb(Zr,Ti)O3
thin films and Pt electrodes for high density FeRAM devices" |
Integrated Ferroelectrics, Vol. 48, 139 (2003) |
|
50
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Dong-Su
Lee, Hyun-Jung Woo, Dong-Yeon Park, Jowoong Ha, Cheol Seong Hwang, and Euijoon
Yoon, "Effects of the microstructure of platinum electrode on the oxidation
behavior of TiN diffusion barrier layer" |
Jpn.
J. Appl. Phys., 42 (Part 1, No. 2A), 630 (2003).
|
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49
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Jieun
Lim, Dong-Yeon Park, Jae Kyoung
Jung, Gregor Darlinski, Hyeong Joon
Kim, Cheol Seong
Hwang, Seung-Hyun Kim, Chang
Young Koo, Hyun-Jung Woo,
Dong-Su Lee and Jowoong Ha,
"Dependence
of ferroelectric performance of sol-gel
derived Pb(Zr,Ti)O3 thin films on bottom-Pt-electrode
thickness" |
Appl.
Phys. Lett.,3224
(2002).
|
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48
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Seung-Hyun
Kim, Dong-Yeon Park, Hyun-Jung Woo,
Dong-Su Lee, Jowoong Ha, Cheol Seong
Hwang, In-Bo Shim, and A.I. Kingon, "Orientation
effects in chemical solution derived
Pb(Zr0.3,Ti0.7)O3
thin films on ferroelectric properties" |
Thin
Solid Films, 416, 264 (2002).
|
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47
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Á¶±Ý¼®,
ÀÓÁöÀº, ±Ç¿À¼º, Ȳö¼º / ±è½ÂÇö, À̵¿¼ö
"°À¯Àüü¹Ú¸·
CapacitorÀÇ °À¯Àü Ư¼º Æò°¡" |
¼¼¶ó¹Ì½ºÆ®,
5 (4),
80(2002).
|
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46
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Seung-Hyun
Kim, Hyun-Jung Woo, Chang
Young Koo, Jeong Suong Yang,
Su-Min Ha, Dong-Yeon Park,
Dong-Su Lee and Jowoong Ha, "Effects
of heterostructure electrodes on the
reliability of ferroelectric PZT thin
films" |
J.
Korean Ceram. Soc., 39(4), 341 (2002).
|
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45
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Jin
Shi-Zhao, Ji Eun Lim, Seehwa Chung,
Moon Joo Cho, Cheol Seong Hwang and
Seung-Hyun
Kim, "Heat-treatment induced
ferroelectric fatigue of Pt/Sr1-xBi2+yTa2O9/Pt
thin-film capacitors" |
Appl.
Phys. Lett., 81(8),
(2002). |
|
44
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Seung-Hyun
Kim, Dong-Yeon Park, Hyun-Jung Woo, Dong-Su Lee, Jowoong Ha, and Cheol Seong
Hwang, "The effects of IrO2/Pt hybrid electrodes on the
crystallization and ferroelectric performances of sol-gel-derived Pb(Zr,Ti)O3
thin film capacitors" |
J.
Mater. Res., 17(7), 1735 (2002). |
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43
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J-P.
Maria, K. Cheek, S.K. Streiffer, Seung-Hyun
Kim, G. Dunn and A.I. Kingon, "Lead
Zirconate Titanate thin films on base-metal
foils; An approach for embedded high
K passive components" |
J.
Am. Ceram. Soc., 84, 2436 (2001).
|
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42
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S.F.
Karmanenko, A.I. Dedyk, A.A. Melkov,
R.N. Il'in, V.I. Sakharov, I.T. Serenkov
and Jowoong Ha, "Structural
features and phase transition temperature
of BaxSr1-xTiO3
films grown on various substrates" |
J.
Phys.: Condens. Matter, 13, 1 (2001).
|
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41
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Seung-Hyun
Kim, Dong-Yeon Park, Hyun-Jung Woo, Dong-Su Lee, Jowoong Ha, Cheol Seong
Hwang, Seehwa Jeong and Angus I. Kingon, "The
low-voltage-switching behavior of sol-gel-derived
Pb(Zr,Ti)O3
thin film capacitors" |
Integrated
Ferroelectrics, 39, 13 (2001).
|
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40
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Seung-Hyun
Kim, Hyun-Jung Woo, Chang-Young Koo, Dong-Su Lee, and Jowoong Ha, "Ferroelectric
fatigue in sol-gel derived Pb(Zr0.40Ti0.60)O3
thin films having Pt bottom and PtOx
top electrodes" |
submitted
to Appl. Phys. Lett.
|
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39
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Seung-Hyun
Kim, Jowoong Ha, Cheol Seong
Hwang, and Angus I. Kingon, "Ca-
and Sr-doped (Pb1-xLax)(ZryTi1-y)1-x/4O3
thin films for low-voltage operation" |
Thin
Solid Films, 394, 131 (2001).
|
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38
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Jowoong
Ha, Dong-Yeon Park, Hyun-Jung Woo, Seung-Hyun Kim, and Dong-Su Lee, "Effects of
electrodes on the electrical properties of ferroelectric devices" |
CSJ, 7,
55 (2001). |
|
37
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Seung-Hyun
Kim, Hyun-Jung Woo, Jowoong Ha, Cheol Seong Hwang, Hae Ryoung Kim, and Angus I.
Kingon, "Thickness effects on imprint in chemical-solution-derived
(Pb,La)(Zr,Ti)O3 thin films" |
Appl.
Phys. Lett., 78(19), (2001). |
|
36
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Dong-Su
Lee, Dong-Yeon Park, Hyun-Jung Woo, Seung-Hyun Kim, Jowoong Ha, and Euijoon
Yoon, "Preferred orientation controlled giant grain growth of platinum thin
films on amorphous substrates" |
Jpn.
J. Appl. Phys., 40 (Part 2, No. 1A/B), L1 (2001).
|
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35
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Soon-Gil
Yoon, Dwi Wicaksana, Dong-Joo Kim, Seung-Hyun Kim, and A.I.Kingon, "Effect
of hydrogen on (Pb,La)(Zr,Ti)O3 (PLZT)
thin film capacitors with Pt or Ir-based
top electrodes" |
Proceedings
of 12th ISAF, 949 (2000).
|
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34
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Soon-Gil
Yoon, A.I. Kingon, and Seung-Hyun Kim, "Relaxation and leakage current
characteristics of Pb1-xLax(ZryTi1-y)1-x/4O3
thin films with various Ir-based top electrodes" |
J.
Appl. Phys., 88(11), 6690 (2000). |
|
33
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Seung-Hyun
Kim, Dong-Su Lee, Cheol Seong Hwang, Dong-Joo Kim, and A.I. Kingon, "Thermally
induced voltage offsets in Pb(Zr,Ti)O3 thin films" |
Appl.
Phys. Lett., 77(19), 3036 (2000). |
|
32
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Seung-Hyun
Kim, D-J. Kim, J-P. Maria, S. K. Streiffer, J. Im, O. Auciello, A. R.
Krauss, and A.I. Kingon, "Influence of Pt heterostructure bottom
electrodes on SrBi2Ta2O9
thin film properties" |
Appl.
Phys. Lett., 76(4), 496 (2000). |
|
31
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Chang
Young Koo, and H.Y. Lee, "Ferroelectric
Sr2(Nb,Ta)2O7
thin films prepared by chemical solution
deposition technique" |
Jpn.
J. Appl. Phys., 37 (Part 1, No. 9), 5521 (2000).
|
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30
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Seung-Hyun
Kim, D-J. Kim, K. M. Lee, M. Park, A. I. Kingon, R. J. Nemanich, J. Im, and
S.K. Streiffer, "An
optimized process for fabrication of
SrBi2Ta2O9 thin films using a novel
chemical solution deposition technique" |
J.
Mater. Res., 14(11), 4395 (1999). |
|
29
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Seung-Hyun
Kim, D-J. Kim, S.K. Streiffer, and A.I. Kingon, "Preparation
and ferroelectric properties of mixed composition layered
PZT thin films for non-volitile memory
applications" |
J.
Mater. Res., 14(6), 2476 (1999).
|
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28
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Seung-Hyun
Kim, D-J. Kim, J.G. Hong, S.K. Streiffer, and A.I. Kingon, "Imprint
and fatigue properties of chemical solution
derived Pb1-xLa(ZryTi1-y)1-x/4O3
thin films" |
J.
Mater. Res., 14(4), 1371 (1999).
|
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27
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Min
Hong Kim, Tae-Soon Park, Euijoon Yoon, Dong-Su Lee, Dong-Yeon Park, Hyun-Jung
Woo, Dong-Il Chun, and Jowoong Ha, "Changes in preferred orientation of Pt thin
films deposited by DC magnetron sputtering using Ar/O2 gas mixtures" |
J.
Mater. Res., 14(4), 1255 (1999). |
|
26
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Seung-Hyun
Kim, J.G. Hong, S.K. Streiffer, and A.I. Kingon, "The
effect of RuO2/Pt
hybrid bottom electrode structure on
the leakage and fatigue properties of
chemical solution derived Pb(ZrxTi1-x)O3
thin films" |
J.
Mater. Res., 14(3), 1018 (1999). |
|
25
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Min
Hong Kim, Tae-Soon Park, Dong-Su Lee, Euijoon Yoon, Dong-Yeon Park, Hyun-Jung
Woo, Dong-Il Chun, and Jowoong Ha, "Highly (200)-oriented Pt films on SiO2/Si
substrates by seed selection through amorphization and controlled grain growth" |
J.
Mater. Res., 14(3), 634 (1999).
|
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24
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J.
Im, O. Auciello, A.R. Krauss, D.M Gruen,
R.P.H. Chang, Seung-Hyun
Kim, A.I. Kingon, "Studies
of hydrogen-induced degradation processes
in SBT ferroelectrics film-based capacitors
using in-situ time of flight masses
spectroscopy of recoiled ions" |
Appl.
Phys. Lett., 74(8), 1162 (1999). |
|
23
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Y.S.
Ahn, D.S. Lee, E J. Ahn, and E. Yoon, "Deposition of PbTiO3 thin
films by reactive sputtering" |
Çѱ¹Áø°øÇÐȸÁö, 3 (2), 126 (1999). |
|
22
|
H.
Maiwa, J.A. Christman, Seung-Hyun Kim,
D-J. Kim, J-P. Maria, B. Chen, S.K. Streiffer,
and A.I. Kingon, "Measurement
of piezoelectric displacement of PZT
thin films using a Double-Beam Interferometer" |
Jpn.
J. Appl. Phys., 38 (Part 1, No. 9B), 5402 (1999).
|
|
21
|
Seung-Hyun
Kim, D-J. Kim, J. Im, C.E. Kim, and A.I Kingon, "Ferroelectric
properties of new chemical solution
derived SBT thin films for non-volatile
memory devices" |
J.
Sol-Gel Sci. and Tech., 16(1/2), 57
(1999). |
|
20
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Seung-Hyun
Kim, D-J. Kim, J-P. Maria, J. Im, S.K. Streiffer, and A.I. Kingon, "Impact
of changes in the Pt heterostructure
bottom electrodes on the ferroelectric
SBT thin film properties" |
Integrated
Ferroelectrics
, 26, 253 (1999).
|
|
19
|
D-J. Kim,
Seung-Hyun
Kim, J-P. Maria, and A.I. Kingon, "Influence
on imprint failure of SrBi2Ta2O9
thin film capacitors" |
Integrated
Ferroelectrics
, 25, 351 (1999).
|
|
18
|
H.
Maiwa, J-P. Maria, J.A. Christman, Seung-Hyun
Kim, S.K. Streiffer, and A.I. Kingon, "Measurement
and calculation of PZT thin film longitudinal
piezoelectric coefficients" |
Integrated
Ferroelectrics
, 24, 139 (1999).
|
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17
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J.A
Christman, H. Maiwa, Seung-Hyun
Kim, A.I. Kingon, and R.J. Nemanich, "Piezoelectric
measurements with atomic force microscopy" |
Mat.
Res. Soc. Symp. Proc., 541, 617 (1999).
|
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16
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D-J. Kim,
Seung-Hyun
Kim, J-P. Maria, and A.I. Kingon, "Thermally
induced imprint of PZT and SBT thin
films" |
Mat.
Res. Soc. Symp. Proc., 541, 469 (1999).
|
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15
|
J.
Im, O. Auciello, A.R. Krauss, D.M. Gruen,
R.P.H. Chang, Seung-Hyun
Kim, and A.I. Kingon, "In
situ mass spectroscopy of recoiled ion
studies of degradation processes in
SrBi2Ta2O9
thin films during hydrogen gas annealing" |
Mat.
Res. Soc. Symp. Proc., 541, 287 (1999).
|
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14
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K.M.
Lee, D. Thomas, Seung-Hyun
Kim, J-P. Maria, A.I. Kingon, and H.M. Jang "Studies
of electrical polarization fatigue in
SrBi2Ta2O9
thin films" |
Mat.
Res. Soc. Symp. Proc., 541, 241 (1999).
|
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13
|
Seung-Hyun
Kim, D-J. Kim, S.K. Streiffer, J-P. Maria, and A.I. Kingon, "Ferroelectric
properties of SBT (Sr/Bi/Ta=0.8/2.3/2)
thin films using a novel chemical solution
deposition" |
Mat.
Res. Soc. Symp. Proc., 541, 223 (1999).
|
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12
|
Seung-Hyun
Kim, D-J. Kim, J.G Hong, S.K. Streiffer, and A.I. Kingon, "Thermally
induced imprint properties of chemical
solution derived PLZT thin films" |
Integrated
Ferroelectrics
, 22, 133 (1998).
|
|
11
|
Seung-Hyun
Kim, J.G. Hong, H.Y. Lee, J.C. Gunter, S.K. Streiffer, and A.I. Kingon,
"The
effects of RuO2/Pt
hybrid bottom electrode structure and
ferroelectric properties of sol-gel
derived PZT thin films¡± |
Mat.
Res. Soc. Symp. Proc., 493, 131 (1998). |
|
10
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Seung-Hyun
Kim, Y.S. Choi, D.Y. Yang, and C.E. Kim, "The
effects of PbTiO3 thin template layer
and Pt/RuO2 hybrid electrode on the
ferroelectric properties of sol-gel
derived PZT thin film" |
Thin
Solid Films, 325, 72 (1998).
|
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9
|
Y.S.
Choi, Seung-Hyun
Kim, H.S. Song, C.E. Kim, D.Y. Yang, Y.C. Chun, J.H. Joo, J.M. Sun, and
K.Y. Oh, "The ferroelectric
properties of sol-gel derived PLZT thin
film for high density FeRAM application" |
J.
Korea Phys. Soc., 32, S1687 (1998).
|
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8
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Seung-Hyun
Kim, Y.S. Choi, Y.J. Oh, and C.E. Kim, "Preparation
of Pb(Zr0.52Ti0.48)O3
thin films on Pt/RuO2
double electrode by a new sol-gel route" |
J.
Mater. Res., 12(6), 1576 (1997).
|
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7
|
Seung-Hyun
Kim, Y.J. Oh, and C.E. Kim, "Influence
of Al2O3
buffer layer on the crystalline structure
and dielectric property of PbTiO3
thin film by sol-gel processing" |
J.
Mater. Sci. Lett., 16, 257 (1997).
|
|
6
|
Seung-Hyun
Kim, Y.J. Oh, and C.E. Kim, "Influence
of Al2O3
diffusion barrier and PbTiO3
seed layer on microstructural and ferroelectric
characteristics of PZT thin films by
sol-gel processing" |
Thin
Solid Films, 305, 321 (1997).
|
|
5
|
Hyun-Jung Woo, D-J.
Choi, and G.H. Kim, "Tilt-axis
effect on oxidation behavior and capacitance-voltage
characteristics of (100) silicon" |
J.
Mater. Sci., 32, 6101 (1997). |
|
4
|
Yong
Soo Choi, Soo Doo Choe, Seung-Hyun
Kim, Chang Eun Kim, and Doo Young
Yang, "Characterization
of PLZT on platinum electrodes for high
density FRAM application" |
Mat.
Res. Soc. Symp. Proc., 446, 337 (1997).
|
|
3
|
Min
Hong Kim, Tae-Soon Park, Dong-Su Lee, Dong-Yeon Park, Hyun-Jung Woo, Jowoong
Ha, Dong-Il Chun, and Euijoon Yoon, "Stress of platinum thin films deposited by
DC magnetron sputtering using argon/oxygen gas mixture" |
Mat.
Res. Soc. Symp. Proc., 441, 427 (1997).
|
|
2
|
Dong-Su
Lee, Dong-Yeon Park, Min Hong Kim, Dong-Il Chun, Jowoong Ha, and Euijoon Yoon, "Characterization
of platinum films deposited by a two-step magnetron sputtering on SiO2/Si
substrates¡± |
Mat.
Res. Soc. Symp. Proc., 441, 341 (1997). |
|
1
|
Dong-Yeon
Park, D-S. Lee, Min Hong Kim, Tae-Soon Park, Hyun-Jung Woo, Euijoon Yoon,
Dong-Il Chun, and Jowoong Ha, "(100) oriented platinum thin films deposited by DC
magnetron sputtering on SiO2/Si substrates¡± |
Mat.
Res. Soc. Symp. Proc., 441, 335 (1997). |
|
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 |