Issued

 

Title

 No.

Date

17

Apparatus and method of forming preferred
orientation-controlled platinum films using oxygen

US 6498097

2002.12.24

16

Apparatus and method of forming preferred
orientation-controlled platinum films using nitrogen

EU 0853336

2001.12.20.

15

Method of forming a (200)-oriented platinum layer

US 6312567 B1

2001.11. 6.

14

Apparatus and method of forming preferred
orientation-controlled platinum films using oxygen

KP 0292288

2001. 3.22.

13

Apparatus and method of forming preferred
orientation-controlled platinum films using nitrogen

JP 3094382

2000. 8. 4.

12

Apparatus and method of forming preferred
orientation-controlled platinum films using nitrogen

KP 0262909

2000. 5. 9.

11

Apparatus and method of depositing a platinum film with
anti-oxidizing function over a substrate

KP 0262908

2000. 5. 9.

10

Apparatus and method of depositing a platinum film with
anti-oxidizing function over a substrate

US 6054331

2000. 4.25.

9

Apparatus and method of forming preferred
orientation-controlled platinum films using nitrogen

US 6025205

2000. 2.15.

8

Method for depositing a platinum layer on a silicon wafer

US 5981390

1999.11. 9.

7

Apparatus and method of forming preferred
orientation-controlled platinum films using nitrogen

JP 2974006

1999. 9. 3.

6

Apparatus and method of depositing a platinum film with
anti-oxidizing function over a substrate

JP 2929286

1999. 5.21.

5

Method of depositieng a platinum layer with a preferred (200)
rientation on a substrate and an electric device having a
plainum layer deposited by the method thereof

KP 02147654

1999. 5.20.

4

Method of depositieng a platinum layer with a preferred (200)
orientation on a substrate and an electric device having a
plainum layer deposited by the method thereof

JP 2916116

1999. 4.16.

3

Method for depositing a platinum layer on a silicon wafer

KP 174594

1998.11. 5.

2

Method for depositing a platinum layer on a silicon wafer

JP 2782176

1998. 5.22.

1

Method for depositing a platinum layer on a silicon wafer

US 5736422

1998. 4. 7.

 

Pending

 

Title

 Country

Date

6

Method of manufacturing metallic film consisting of giant single crystal grains

Japan

2001. 7.31.

5

Method of manufacturing metallic film consisting of giant single crystal grains

 US

2001. 7.30.

4

Metal resistor device and method for manufacturing the same

Korea

2001. 2.24.

3

Method of manufacturing metallic film consisting of giant single crystal grains

Korea

2000. 7.31.

2

Apparatus and method of forming preferred
orientation-controlled platinum films using oxygen

EU

1998. 5. 6.

1

Method of depositing a platinum film for capacitor electrode

EU

1998. 1. 9.